The on-orbit measurements of single event phenomena by ETA-V spacecraft
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 38 (6) , 1693-1699
- https://doi.org/10.1109/23.124164
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- The measurement and prediction of proton upsetIEEE Transactions on Nuclear Science, 1989
- The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS DevicesIEEE Transactions on Nuclear Science, 1986
- Single Event Effects in High Density CMOS SRAMsIEEE Transactions on Nuclear Science, 1986
- Statistics of ExtremesPublished by Columbia University Press ,1958