Reconstruction of Objects from Their Projections. The Influence of Measurement Errors on the Reconstruction
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (1) , 850-864
- https://doi.org/10.1109/TNS.1977.4328793
Abstract
A two dimensional layer of a three dimensional object can be reconstructed by means of a large number of projections through this layer using a convolution technique. The quality of the reconstructed image is limited by noise in the primary projection data. Different sources of noise have been investigated. Their influence on image quality is calculated. Ultimate limits in spatial and density resolution are derived.Keywords
This publication has 14 references indexed in Scilit:
- Reconstruction of object layers from their X-ray projections: A simulation studyComputer Graphics and Image Processing, 1976
- Pseudo Fan Beam Reconstruction Algorithms and Their Related Physical ProblemsIEEE Transactions on Nuclear Science, 1976
- Tomographic Reconstruction from Fan Beam Geometry Using Radon's Integration MethodIEEE Transactions on Nuclear Science, 1975
- A Comparative Study of 3-D Image Reconstruction Algorithms with Reference to Number of Projections and Noise FilteringIEEE Transactions on Nuclear Science, 1975
- The EMI scanner. A brief review of the first 650 patientsThe British Journal of Radiology, 1974
- Computer Algorithms and Detector Electronics for the Transmission X-Ray TomographyIEEE Transactions on Nuclear Science, 1974
- Reconstructing Interior Head Tissue from X-Ray TransmissionsIEEE Transactions on Nuclear Science, 1974
- Image reconstruction from finite numbers of projectionsJournal of Physics A: Mathematical, Nuclear and General, 1973
- Three-dimensional Reconstruction from Radiographs and Electron Micrographs: Application of Convolutions instead of Fourier TransformsProceedings of the National Academy of Sciences, 1971
- The reconstruction of a three-dimensional structure from projections and its application to electron microscopyProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1970