Phase-noise behaviour of frequency dividers implemented with GaAs heterojunction bipolar transistors

Abstract
Near carrier phase-noise performance of GaAs microwave frequency dividers (4 GHz) is investigated. The divide-by-4 circuits are fabricated using heterojunction bipolar transistor (HBT) technology. The phase-noise behaviour of the HBT divider chips is correlated with transistor 1/f noise and is insensitive to bias current variations.

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