Transmission electron microscopy study of chemical-vapor-deposited diamond by a side-view method

Abstract
The initial growth of synthetic diamond by dc plasma-jet chemical vapor deposition was studied with a transmission electron microscope by a side-view method. Both diamond particles and β-SiC particles were observed on the Si substrate. Si atoms in the substrate were etched clearly by the plasma jet except beneath diamond particles.

This publication has 5 references indexed in Scilit: