Direct surface imaging in small metal particles
- 1 May 1983
- journal article
- Published by Springer Nature in Nature
- Vol. 303 (5915) , 316-317
- https://doi.org/10.1038/303316a0
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Recent improvements to the Cambridge University 600 kV High Resolution Electron MicroscopeJournal of Microscopy, 1983
- Calculation of the scattering from defects using periodic continuation methodsPhilosophical Magazine A, 1982
- Optimisation and applications of the Cambridge University 600 kV high resolution electron microscopeUltramicroscopy, 1982
- Observation of atomic steps of (111) surface of a silicon crystal using bright field electron microscopyUltramicroscopy, 1981
- High resolution studies of small particles of gold and silverJournal of Crystal Growth, 1981
- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981
- Surface study by an UHV electron microscopeSurface Science, 1979
- Direct resolution of surface atomic steps by transmission electron microscopyPhilosophical Magazine, 1974
- Images of Thorium Atoms in Transmission Electron MicroscopyJapanese Journal of Applied Physics, 1971
- Visibility of Single AtomsScience, 1970