Modification of Poisson statistics: modeling defects induced by diffusion
- 1 October 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 12 (5) , 540-546
- https://doi.org/10.1109/jssc.1977.1050952
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Defect analysis and yield degradation of integrated circuitsIEEE Journal of Solid-State Circuits, 1974
- Applying a composite model to the IC yield problemIEEE Journal of Solid-State Circuits, 1974
- Defect density distribution for LSI yield calculationsIEEE Transactions on Electron Devices, 1973
- Mapping of electrical leakage in transistors by anodic oxidationIEEE Transactions on Electron Devices, 1972
- Computation of integrated-circuit yields from the distribution of slice yields for the individual devicesIEEE Transactions on Electron Devices, 1968
- Cost-size optima of monolithic integrated circuitsProceedings of the IEEE, 1964