Near-surface stoichiometry of high temperature superconducting YBaCuO thin films

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Abstract
The surface morphology and near-surface chemical composition of high temperature superconducting Y–Ba–Cu–O thin films have been studied by Scanning Electron Microscopy (SEM) and Auger Electron Spectroscopy (AES) depth profiling. These films were fabricated on SrTiO3 substrates by RF diode sputter deposition and subsequent furnace annealing in oxygen. The chemical composition at and near the surface of thin films was found to differ from the bulk composition. At about 500 Å below the surface the Y, Ba, and Cu stoichiometry, as determined by AES, gradually approach that of the film interior. These results suggest that, for furnace annealed films, there may exist a minimum deposited Y–Ba–Cu–O film thickness in which superconductivity is possible. It was also found that the calculated copper concentration determined by AES during depth profiling is significantly lower than its actual value.