Suppression of molecular ions in the secondary ion mass spectra of minerals
- 1 October 1983
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 5 (5) , 181-185
- https://doi.org/10.1002/sia.740050503
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Applications of the Ion Microprobe to Geochemistry and CosmochemistryAnnual Review of Earth and Planetary Sciences, 1982
- Trace element incorporation into growing augite phenocrystNature, 1981
- Trace element analysis with the ion probeScanning, 1980
- High-resolution ion-microprobe measurement of lead isotopes: Variations within single zircons from Lac Seul, northwestern OntarioEarth and Planetary Science Letters, 1979
- Geochemical applications of quantitative ion-microprobe analysisGeochimica et Cosmochimica Acta, 1978
- Secondary Ion Mass Spectra of ApatitesZeitschrift für Naturforschung A, 1978
- Static secondary ion mass spectroscopy (SSIMS) analysis of the mica surfaceSurface Science, 1978
- U, Th, Pb and REE abundances and207Pb/206Pb ages of individual minerals in returned lunar material by ion microprobe mass analysisEarth and Planetary Science Letters, 1972
- Determination of trace elements in standard reference materials by neutron activition analysisAnalytica Chimica Acta, 1967
- Étude d’une méthode d’analyse locale chimique et isotopique utilisant l’émission ionique secondaireAnnales de Physique, 1964