Static secondary ion mass spectroscopy (SSIMS) analysis of the mica surface
- 2 February 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 71 (3) , 541-547
- https://doi.org/10.1016/0039-6028(78)90445-4
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Crystal structures and their secondary ion mass spectraSurface Science, 1975
- Adsorption of gases studied by secondary ion emission mass spectrometrySurface Science, 1975
- Surface stoichiometry and structure of GaAsSurface Science, 1974
- A depth analysis of cleaved mica surfaces monitored by auger spectroscopyRadiation Effects, 1973
- Electric dipoles on clean mica surfacesSurface Science, 1969
- Analysis of the gases released on cleaving muscovite mica in ultrahigh vacuum and of gases which remain adsorbed on the freshly cleaved surfaceVacuum, 1967