The Critical Voltage Effect in Transmission Electron Microscopy IV. Influence of High-Order Systematic Reflections
- 1 August 1975
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 70 (2) , 577-590
- https://doi.org/10.1002/pssb.2220700217
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- The critical voltage effect in transmission electron microscopy. II. A theoretical study neglecting absorption effectsPhysica Status Solidi (b), 1975
- The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam CasePhysica Status Solidi (b), 1974
- The critical voltage effect in high voltage electron microscopyPhilosophical Magazine, 1972
- A Particular Many Beam Situation in Transmission Electron DiffractionPhysica Status Solidi (b), 1971
- The analytical representation of atomic scattering amplitudes for electronsActa Crystallographica, 1962