Electron-beam diagnostics for Jefferson Lab's high power free electron laser
- 22 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 912-914
- https://doi.org/10.1109/pac.1997.749879
Abstract
In this paper the current plans for the diagnostic complement for Jefferson Lab's IRFEL are presented. Diagnostic devices include optical transition radiation beam viewers, both stripline and button beam position monitors, multislit beam emittance measuring devices, coherent synchrotron and transition radiation bunch length monitoring devices, and synchrotron light cameras for measuring the beam profile at high average power. Most devices have update rates of order 1 sec or shorter, and all are controlled through an EPICS control system.Keywords
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