EXAFS studies on superficial regions by means of total reflection

This publication has 16 references indexed in Scilit:

• EXAFS of a thin film of Cu measured by total reflection
  Physica Status Solidi (a), 1980
• EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge
  Physica Status Solidi (a), 1979
• Extended-x-ray-absorption-fine-structure studies of low-$Z$ atoms in solids and on surfaces: Studies of ${\mathrm{Si}}_3$${\mathrm{N}}_4$, Si${\mathrm{O}}_2$, and oxygen on Si(111)
  Physical Review B, 1979
• EXAFS of ultra thin layers of Cu
  Journal of Physics C: Solid State Physics, 1978
• Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)
  Physical Review Letters, 1978
• Extended-x-ray-absorption-fine-structure study of theBr2-graphite system
  Physical Review B, 1978
• Measurements of X-Ray Anomalous Scattering Factors near the Cu K Absorption Edge by the Use of Synchrotron Radiation
  Japanese Journal of Applied Physics, 1978
• Application of the Dispersion Relation to Determine the Anomalous Scattering Factors
  Japanese Journal of Applied Physics, 1978
• New application of extended x-ray absorption fine structure (EXAFS) as a surface probe-nature of oxygen interaction with a ruthenium catalyst
  The Journal of Chemical Physics, 1977
• Extended x‐ray‐absorption fine structure (EXAFS) and its application to surface structure
  Journal of Vacuum Science and Technology, 1977