EXAFS of a thin film of Cu measured by total reflection
- 16 January 1980
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 57 (1) , K31-K34
- https://doi.org/10.1002/pssa.2210570160
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Structure determination by X-ray absorptionContemporary Physics, 1978
- Improved extended-x-ray-absorption fine-structure (EXAFS) studies applied to the investigation of Cu-O, Cu-N, and Cu-Br bond lengthsPhysical Review B, 1978
- Application of the Dispersion Relation to Determine the Anomalous Scattering FactorsJapanese Journal of Applied Physics, 1978
- Determination of Bond Lengths from EXAFS with High ResolutionJapanese Journal of Applied Physics, 1978
- Precise interferometric measurement of the NiK-edge forward scattering amplitude with synchrotron X-raysZeitschrift für Physik B Condensed Matter, 1976
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954