Improved extended-x-ray-absorption fine-structure (EXAFS) studies applied to the investigation of Cu-O, Cu-N, and Cu-Br bond lengths
- 15 February 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 17 (4) , 1481-1488
- https://doi.org/10.1103/physrevb.17.1481
Abstract
Extended-x-ray-absorption fine-structure spectra in the region of the edge are presented for Cu, CuO, O, CuS, CuS·5O, Cu, Cu(N)·3O, , and Cu. By the usual Fourier-analysis method, bond lengths for Cu-O, Cu-N, and Cu-Br are determined. Further, a back-transformation into real space is used which allows us to check the consistency of the evaluation for the whole energy range investigated. The advantages of this evaluation are: bond lengths can be taken from regions of high accuracy of the experimental data, the dependence of the phase shifts can be checked and this presentation gives a criterion on how to fit the reference energy necessary for the energy-momentum conversion. The bond lengths determined with this method agree to within 0.02 ÅA with reliable x-ray diffraction data.
Keywords
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