Appearance Potential X-ray Fluorescence Analysis
- 1 January 1988
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Soft x‐ray appearance‐potential study of Ti–Ni systemSurface and Interface Analysis, 1985
- Quantitative chemical analysis of 3d transition metal alloys by SXAPSPhysica Status Solidi (a), 1984
- Quasi-Instantaneous Measurements of Titanium Compounds Using Auger Electron and Auger Electron Appearance Potential SpectroscopiesJapanese Journal of Applied Physics, 1984
- The naval research laboratory materials analysis beam line at the national synchrotron light sourceNuclear Instruments and Methods in Physics Research, 1983
- Synchrotron radiation x-ray fluorescence analysisAnalytical Chemistry, 1983
- Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin filmsSolid State Communications, 1977
- Soft x-ray appearance potential spectroscopyJournal of Vacuum Science and Technology, 1974