Diagnosing ADC nonlinearity at the bit level
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 38 (6) , 1139-1141
- https://doi.org/10.1109/19.46415
Abstract
No abstract availableKeywords
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- Dynamic testing and diagnostics of A/D convertersIEEE Transactions on Circuits and Systems, 1986
- Full-speed testing of A/D convertersIEEE Journal of Solid-State Circuits, 1984