Fizeau interferometry for measuring refractive index and thickness of nearly transparent films
- 15 November 1978
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 17 (22) , 3636-3640
- https://doi.org/10.1364/ao.17.003636
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
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- Error in Dielectric-Film Ellipsometer Determinations due to Neglect of Film Absorption*Journal of the Optical Society of America, 1965