Improvement of Electrode/Organic Layer Interfaces by the Insertion of Monolayer-like Aluminum Oxide Film
- 1 July 1998
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 37 (7B) , L872
- https://doi.org/10.1143/jjap.37.l872
Abstract
Insertion of a thin film of aluminum oxide (Al2O3) at the interface of electrodes and organic layers has been investigated. Insertion of a thin film of Al2O3 at the interface of the ITO anode and the diamine derivative (TPD) layers, as well as at the interface of the 8-hydroxyquinoline aluminum (Alq3) and the Mg:Ag cathode in the electroluminescent (EL) diode has been examined. The insertion of an Al2O3 layer with a proper thickness was observed to enhances the emission efficiency of the device. The mechanism of quantum efficiency enhancement of the device was studied.Keywords
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