Effects of Noise on Transfer-Trip Carrier Relaying
- 1 January 1968
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Apparatus and Systems
- Vol. PAS-87 (1) , 173-179
- https://doi.org/10.1109/TPAS.1968.292268
Abstract
A test method is described for the measurement of the probability of error due to noise in transfer-trip (TT) relaying using power line carrier. Noise levels recorded on 230-kV carrier installations are given to permit the interpretation of the measured error probabilities in terms of reliability and security. Three possible applications of the method are demonstrated: 1) finding the required biasing for frequency-shift-keying receivers, 2) preservice checking of transfer-trip channels, and 3) comparison of different transfer-trip systems.Keywords
This publication has 4 references indexed in Scilit:
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- Valuation or Transrer-Rip Relaying Sing Ower-Ine Arrier AIEE Committee ReportTransactions of the American Institute of Electrical Engineers. Part III: Power Apparatus and Systems, 1962
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