X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal
- 1 April 1989
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science
- Vol. 24 (4) , 1273-1280
- https://doi.org/10.1007/pl00020207
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Dislocation Pile-Up Mechanism for Initiation of Energetic CrystalsPublished by Springer Nature ,1986
- Dislocations in energetic materialsJournal of Materials Science, 1984
- X-ray orientation and hardness experiments on RDX explosive crystalsJournal of Materials Science, 1984
- Adiabatic heating at a dislocation pile-up avalancheActa Metallurgica, 1982
- Description of “Hot Spots” Associated with Localized Shear Zones in Impact TestsPublished by Springer Nature ,1981
- Laboratory Techniques for X-ray Reflection TopographyPublished by Springer Nature ,1980
- The relationship of Impact Sensitivity with Structure of Organic High Explosives. II. Polynitroaromatic explosivesPropellants, Explosives, Pyrotechnics, 1979
- X-Ray Diffraction MicroscopyPublished by Springer Nature ,1973
- An x-ray topographic study of defect structures in cyclotrimethylene trinitraminePhysica Status Solidi (a), 1971
- Dislocation etching of cyclotrimethylene trinitramine crystalsJournal of Crystal Growth, 1969