Topography of defects at atomic resolution using scanning tunneling microscopy
- 1 March 1987
- journal article
- Published by Elsevier in Surface Science
- Vol. 181 (1-2) , 139-144
- https://doi.org/10.1016/0039-6028(87)90150-6
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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