Surface roughness in thin-film growth: The effect of mass transport between layers
- 15 August 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 48 (7) , 4972-4975
- https://doi.org/10.1103/physrevb.48.4972
Abstract
We present one-dimensional simulations using kinetic parameters and deposition conditions typical to epitaxy. We study how various microscopic kinetic parameters influence surface morphology and test scaling predictions made by continuum theories.Keywords
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