Reentrant layer-by-layer growth: A numerical study
- 15 February 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 47 (7) , 4119-4122
- https://doi.org/10.1103/physrevb.47.4119
Abstract
Reentrant layer-by-layer growth is studied using a Monte Carlo simulation of a solid-on-solid model. A previously proposed explanation of the phenomenon based on the existence of an activation barrier for adatom hops off descending steps has been used to reproduce correctly most of the available experimental data. However, based on a detailed inspection of the growth kinetics, we propose a different interpretation of the origin of low-temperature layer-by-layer growth, which stresses the importance of the incorporation mechanism of an atom arriving on the surface.Keywords
This publication has 19 references indexed in Scilit:
- On the shape of the in-phase TEAS oscillations during epitaxial growth of Pt(111)Surface Science, 1992
- Growth of Cu on Cu(100)Surface Science, 1992
- Magic clusters in two dimensions?Physical Review Letters, 1992
- Surfactant-induced layer-by-layer growth of Ag on Ag(111)Physical Review Letters, 1992
- The homoepitaxial growth of Pt on Pt(111) studied with STMSurface Science, 1992
- New phenomena in homoepitaxial growth of metalsApplied Physics A, 1991
- Atom incorporation at surface clusters: An atomic viewPhysical Review Letters, 1991
- Reentrant layer-by-layer growth during molecular-beam epitaxy of metal-on-metal substratesPhysical Review Letters, 1990
- Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 KPhysical Review Letters, 1989
- Intensity oscillations in reflection high-energy electron diffraction during molecular beam epitaxy of Ni on W(110)Applied Physics Letters, 1987