Force-observe, a new design for testability approach (CMOS VLSI circuits)

Publisher Website

6 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iscas.1988.14899

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Designing CMOS Circuits for Switch-Level Testability
IEEE Design & Test of Computers, 1987
Design for testability—A survey
Proceedings of the IEEE, 1983