Design for testability—A survey

1 January 1983

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 71 (1) , 98-112
https://doi.org/10.1109/proc.1983.12531

Abstract

This paper discusses the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today's technologies and techniques which have been recently introduced and will soon appear in new designs.

Keywords

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