Optical Properties of Multisource Thermally Evaporated III–V Semiconductor Compounds
- 1 January 1966
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 5 (1) , 35-40
- https://doi.org/10.1364/ao.5.000035
Abstract
A variety of III–V semiconductor films has been prepared using the multisource technique. The availability of such layers widens the possibilities for applying semiconductors to optical components requiring controlled layers such as interference filters. A study of the dispersion of refractive indices in films of InSb and InAs indicates that such properties behave similarly to those of the bulk materials. However, those absorption processes which are determined by excess carrier scattering can become much larger than in the bulk. Intrinsic edge absorption in n-type InAs films exhibits exponential behavior similar to that of bulk samples having approximately the same carrier concentrations. Solid solutions of III–V mixtures can be effected using the multisource technique permitting studies of such parameters as effective masses and reststrahlen frequencies as functions of the solutions. The reststrahlen frequency for a Ga3/4In1/4Sb film is given.Keywords
This publication has 9 references indexed in Scilit:
- Enhanced Reflectance of Reststrahlen Reflection FiltersApplied Optics, 1965
- CALCULATION OF ELECTRON EFFECTIVE MASS IN III-V ALLOYSCanadian Journal of Physics, 1964
- Some galvanomagnetic and optical properties of Cu doped InSb filmsSolid-State Electronics, 1964
- Optical properties of InAsySb1−y layers prepared by thermal evaporationInfrared Physics, 1964
- Effect of Defect Fields on the Optical Absorption EdgePhysical Review B, 1963
- Infrared lattice reflection spectra of III–V compound semiconductorsJournal of Physics and Chemistry of Solids, 1962
- Optical Properties of-Type Indium Arsenide in the Fundamental Absorption Edge RegionPhysical Review B, 1961
- New Emission Continuum of Helium in the Vacuum Ultraviolet RegionJournal of the Optical Society of America, 1961
- Zur Dickenmessung stäbchenförmiger Objekte in der ElektronenmikroskopieZeitschrift für Naturforschung B, 1958