X-Ray Diffraction and Absorption Topography of Synthetic Diamonds

Publisher Website
Google Scholar
Abstract
Detailed observations were made on two selected GE synthetic diamonds; one was representative of the more perfect specimens, the other of less perfect but more common specimens. Diffraction topography of the more perfect crystal revealed lattice defects interpreted as dislocation bundles radiating from a central region, individual dislocations apparently resolvable locally, and a severely strained surface layer. Dislocations were not resolved in the less perfect specimen. Absorption topography using monochromatic Cu Kα and Cu Kβ radiations showed a nickel‐rich surface film on the more perfect specimen, but few internal Ni‐rich particles. The less perfect specimen contained many Ni‐rich globules 2 to 15 μ in diameter, sheets of submicron‐size Ni‐impurity occluded under certain crystal edges and some Ni‐rich surface film. The face‐centered cubic ``satellite'' diffraction pattern of the less perfect specimen showed the presence of large crystallites misoriented up to 6° from the diamond matrix and fine crystallites closely parallel to the matrix. An explanation is put forward for the development of cube faces on synthetic diamonds.

This publication has 16 references indexed in Scilit: