Studies of Individual Dislocations in Crystals by X-Ray Diffraction Microradiography
- 1 November 1959
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 30 (11) , 1748-1755
- https://doi.org/10.1063/1.1735048
Abstract
The distribution of imperfections within the interior of crystals has been studied using ``projection topographs'' which are x‐ray diffraction images showing a projection of a slice of crystal and the imperfections in it. Individual dislocations have been observed in single crystals of diamond, silicon, germanium, lithium fluoride, sodium chloride, silver chloride, magnesium oxide, calcite, quartz, and aluminum. From the variation of dislocation contrast with the orientation of the x‐ray reflecting plane the direction of Burgers vector can be found. Dislocations can be seen with good contrast when the product of linear absorption coefficient μ and slice thickness t is of the order of unity or less. If μt≫1 the contrast is reversed through the Borrmann effect. Stereo pairs of projection topographs can be prepared from the pair of reflections hkl and h̄k̄l̄.This publication has 11 references indexed in Scilit:
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