Progress report on the development of an area detector data acquisition system for X-ray crystallography and other X-ray diffraction experiments
- 15 May 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 172 (1-2) , 393-395
- https://doi.org/10.1016/0029-554x(80)90670-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- L III -Edge Anomalous X-ray Scattering by Cesium Measured with Synchrotron RadiationScience, 1978
- Electromagnetic delay lines in spark, proportional and drift chamber applicationsNuclear Instruments and Methods, 1978
- The electron stationary picture method for high-speed measurement of reflection intensities from crystals with large unit cellsActa Crystallographica Section A, 1978
- Applications of synchrotron radiation to protein crystallography. II. Anomalous scattering, absolute intensity and polarizationActa Crystallographica Section A, 1977
- A xenon-filled multiwire arc detector for X-ray diffractionActa Crystallographica Section A, 1975