Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer

This publication has 9 references indexed in Scilit:

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  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• The Application of "Thru-Short-Delay" to the Calibration of the Dual Six-Port
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• A New Technique for Calibrating Dual Six-Port Networks with Application to S Parameter Measurements
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
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  IEEE Transactions on Microwave Theory and Techniques, 1978
• A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors
  IEEE Transactions on Microwave Theory and Techniques, 1977
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  IEEE Transactions on Microwave Theory and Techniques, 1977
• A Network Analyzer Incorporating Two Six-Port Reflectometers
  IEEE Transactions on Microwave Theory and Techniques, 1977
• The calibration and use of directional couplers without standards
  IEEE Transactions on Instrumentation and Measurement, 1976
• Calibration of an Arbitrary Six-Port Junction for Measurement of Active and Passive Circuit Parameters
  IEEE Transactions on Instrumentation and Measurement, 1973