Room temperature transformations induced in SiO2 layers by chemical compounds: I
- 1 December 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 55 (3) , 355-360
- https://doi.org/10.1016/0040-6090(78)90152-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Ordered Structure and Ion Migration in Silicon Dioxide FilmsJapanese Journal of Applied Physics, 1968
- Noncrystalline Structure and Electronic Conduction of Silicon Dioxide FilmsPhysica Status Solidi (b), 1967