Behavioral-Level Test Development
- 1 January 1979
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 171-179
- https://doi.org/10.1109/dac.1979.1600105
Abstract
An argument is made that the economics of test development in the LSI-VLSI era require creation and use of test development software aids that operate from high-level behavioral circuit models. Behavioral models are defined to be abstract specifications of the circuit function. Problems with the use of current-day gate-level software aids are discussed. Suggestions are given for implementing behavioral-level test generation tools. Recent work in this area at Texas Instruments Incorporated (TI) is discussed.Keywords
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