Deductive Fault Simulation with Functional Blocks

1 August 1978

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-27 (8) , 689-695
https://doi.org/10.1109/tc.1978.1675175

Abstract

This paper presents a method of propagating the effects of faults through functional blocks using the deductive (fault list) technique. An extension of the method is shown to be effective for simulating internal faults in functional blocks. The techniques presented here have been used for implementing the functional simulation capability in the Logic Analysis for Maintenance Planning (LAMP) System at Bell Laboratories.

Keywords

This publication has 8 references indexed in Scilit:

Comparison of Parallel and Deductive Fault Simulation Methods
IEEE Transactions on Computers, 1974
LAMP: Logic-Circuit Simulators
Bell System Technical Journal, 1974
LAMP: Application to Switching-System Development
Bell System Technical Journal, 1974
LAMP: System Description
Bell System Technical Journal, 1974
A Deductive Method for Simulating Faults in Logic Circuits
IEEE Transactions on Computers, 1972
A model and implementation of a universal time delay simulator for large digital nets
Published by Association for Computing Machinery (ACM) ,1970
Design and Use of Fault Simulation for Saturn Computer Design
IEEE Transactions on Electronic Computers, 1967
On an Improved Diagnosis Program
IEEE Transactions on Electronic Computers, 1965