Growth of well-ordered silicon dioxide films on Mo(112)

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1 April 2000

journal article
conference paper
Published by Elsevier in Microelectronics Reliability

Vol. 40 (4-5) , 841-844
https://doi.org/10.1016/s0026-2714(99)00323-6

Abstract

No abstract available

Keywords

This publication has 17 references indexed in Scilit:

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