Characterization of silicon avalanche photodiodes for photon correlation measurements 3: Sub-Geiger operation
- 1 November 1989
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 28 (21) , 4616-4621
- https://doi.org/10.1364/ao.28.004616
Abstract
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This publication has 11 references indexed in Scilit:
- Absolute measurement of detector quantum efficiency using parametric downconversionApplied Optics, 1987
- Detection of individual 0.4–28 μm wavelength photons via impurity-impact ionization in a solid-state photomultiplierApplied Physics Letters, 1987
- Characterization of silicon avalanche photodiodes for photon correlation measurements 2: Active quenchingApplied Optics, 1987
- Photon statistical properties of visible laser diodesReview of Scientific Instruments, 1987
- Characterization of silicon avalanche photodiodes for photon correlation measurements 1: Passive quenchingApplied Optics, 1986
- Correction of dead-time effects in photoelectric-counting distributionsJournal of the Optical Society of America A, 1986
- Recent developments in silicon avalanche photodiodesMeasurement, 1985
- Multi-element reachthrough avalanche photodiodesIEEE Transactions on Electron Devices, 1984
- Correlations in Light from a Laser at ThresholdPhysical Review B, 1969
- Variation of Junction Breakdown Voltage by Charge TrappingPhysical Review B, 1965