Pyroelectric properties of Al(In)GaN/GaN hetero- and quantum well structures
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- 22 March 2002
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 14 (13) , 3399-3434
- https://doi.org/10.1088/0953-8984/14/13/302
Abstract
The macroscopic nonlinear pyroelectric polarization of wurtzite AlxGa1-xN, InxGa1-xN and AlxIn1-xN ternary compounds (large spontaneous polarization and piezoelectric coupling) dramatically affects the optical and electrical properties of multilayered Al(In)GaN/GaN hetero-, nanostructures and devices, due to the huge built-in electrostatic fields and bound interface charges caused by gradients in polarization at surfaces and heterointerfaces. Models of polarization-induced effects in GaN-based devices so far have assumed that polarization in ternary nitride alloys can be calculated by a linear interpolation between the limiting values of the binary compounds. We present theoretical and experimental evidence that the macroscopic polarization in nitride alloys is a nonlinear function of strain and composition. We have applied these results to interpret experimental data obtained in a number of InGaN/GaN quantum wells (QWs) as well as AlInN/GaN and AlGaN/GaN transistor structures. We find that the discrepancies between experiment and ab initio theory present so far are almost completely eliminated for the AlGaN/GaN-based heterostructures when the nonlinearity of polarization is accounted for. The realization of undoped lattice-matched AlInN/GaN heterostructures further allows us to prove the existence of a gradient in spontaneous polarization by the experimental observation of two-dimensional electron gases (2DEGs). The confinement of 2DEGs in InGaN/GaN QWs in combination with the measured Stark shift of excitonic recombination is used to determine the polarization-induced electric fields in nanostructures. To facilitate inclusion of the predicted nonlinear polarization in future simulations, we give an explicit prescription to calculate polarization-induced electric fields and bound interface charges for arbitrary composition in each of the ternary III-N alloys. In addition, the theoretical and experimental results presented here allow a detailed comparison of the predicted electric fields and bound interface charges with the measured Stark shift and the sheet carrier concentration of polarization-induced 2DEGs. This comparison provides an insight into the reliability of the calculated nonlinear piezoelectric and spontaneous polarization of group III nitride ternary alloys.Keywords
This publication has 61 references indexed in Scilit:
- First-principles prediction of structure, energetics, formation enthalpy, elastic constants, polarization, and piezoelectric constants of AlN, GaN, and InN: Comparison of local and gradient-corrected density-functional theoryPhysical Review B, 2001
- Comparison of N-face and Ga-face AlGaN/GaN-Based High Electron Mobility Transistors Grown by Plasma-Induced Molecular Beam EpitaxyJapanese Journal of Applied Physics, 1999
- Properties of aluminum nitride thin films for piezoelectric transducers and microwave filter applicationsApplied Physics Letters, 1999
- Self-limitation of AlGaN/GaN quantum well energy by built-in polarization fieldApplied Physics Letters, 1999
- Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructuresJournal of Applied Physics, 1999
- InGaN-based violet laser diodesSemiconductor Science and Technology, 1999
- Growth and applications of Group III-nitridesJournal of Physics D: Applied Physics, 1998
- Optical band gap in Ga1−xInxN (0<x<0.2) on GaN by photoreflection spectroscopyApplied Physics Letters, 1998
- Sound velocity of AlxGa1−xN thin films obtained by surface acoustic-wave measurementsApplied Physics Letters, 1998
- Spontaneous polarization and piezoelectric constants of III-V nitridesPhysical Review B, 1997