Recombination of injected charge carriers
- 30 November 1990
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 33 (11) , 1333-1338
- https://doi.org/10.1016/0038-1101(90)90105-n
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Measurement of Carrier Lifetimes in Germanium and SiliconJournal of Applied Physics, 1955
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952
- Electron-Hole Recombination in GermaniumPhysical Review B, 1952
- The Mobility and Life of Injected Holes and Electrons in GermaniumPhysical Review B, 1951