A fault-tolerant 64K dynamic RAM

Publisher Website

1 January 1979

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/isscc.1979.1155986

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

Multiple word/bit line redundancy for semiconductor memories
IEEE Journal of Solid-State Circuits, 1978
A 16 384-bit dynamic RAM
IEEE Journal of Solid-State Circuits, 1976