Another expression for the minimum detectable mass in EELS, EPMA and AES

This publication has 5 references indexed in Scilit:

• Mathematical and physical considerations on the spatial resolution in scanning Auger electron microscopy
  Surface Science, 1983
• A revised expression for signal/noise ratio in EELS
  Ultramicroscopy, 1982
• Detection sensitivity for surface atoms in X-ray photoelectron spectroscopy and X-ray-induced Auger electron spectroscopy
  Applications of Surface Science, 1982
• The microanalysis of light elements using transmitted energy loss electrons
  Ultramicroscopy, 1975
• Precision and sensitivity in electron microprobe analysis
  Analytical Chemistry, 1967