X-ray double-crystal diffractometry of Ga1−xAlxAs epitaxial layers
- 31 December 1978
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 44 (5) , 518-525
- https://doi.org/10.1016/0022-0248(78)90293-2
Abstract
No abstract availableKeywords
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