A System for Analyzing Contact Resistance
- 1 September 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 2 (3) , 317-320
- https://doi.org/10.1109/tchmt.1979.1135465
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Influence of Some Geometric Factors on Contact Resistance Probe MeasurementsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1980
- Electrical Characteristics of Contacts Contaminated with Silver Sulfide FilmIEEE Transactions on Parts, Materials and Packaging, 1970
- Electric ContactsPublished by Springer Nature ,1967