Iterative algorithms for single-side-band holography in bright- and dark-field microscopy

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Abstract
The possibility of finding well-defined band-limited solutions in bright-field and dark-field single-side-band holography has been studied. In particular, the general form of the algorithms which take account of the effect of aperture misalignment on the image wave-function is given. The solution obtained is locally unique. Given the type of specimen in question, the correctness of this solution can be established by numerical exploration of the domain of local convergence. The computer simulations have been chosen with particular reference to faulted crystalline objects at high resolution.