TIGER: testability insertion guidance expert system
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- A knowledge representation scheme for DFTPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test Schedules for VLSI Circuits Having Built-In Test HardwareIEEE Transactions on Computers, 1986
- An Automatic DFT System for the Silc Silicon CompilerIEEE Design & Test of Computers, 1986
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985