High dose implantation of yttrium and barium ions into copper: the use of a sacrificial carbon layer for enhanced retention
- 1 June 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 80-81, 501-504
- https://doi.org/10.1016/0168-583x(93)96169-d
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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