Detailed characterization of Unibond material

This publication has 4 references indexed in Scilit:

• A new lifetime characterization technique using drain current transients in SOI material
  Solid-State Electronics, 1996
• Analysis of floating body induced transient behaviors in partially depleted thin film SOI devices
  IEEE Transactions on Electron Devices, 1996
• Silicon on insulator material technology
  Electronics Letters, 1995
• Characterization of carrier generation in enhancement-mode SOI MOSFET's
  IEEE Electron Device Letters, 1990