Characterization of ceramic films and interfaces by electron microscopic and spectroscopic techniques
- 2 May 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 29 (1-4) , 266-276
- https://doi.org/10.1016/0304-3991(89)90254-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Cross‐Section preparation for tem of film‐substrate combinations with a large difference in sputtering yieldsJournal of Electron Microscopy Technique, 1986
- Scratch adhesion testing of hard coatingsThin Solid Films, 1983
- Improved adhesion of sputtered refractory carbides to metal substratesWear, 1980