Abstract
An improved method is developed which allows the determination of mode frequencies to high accuracy in cylindrical anisotropic dielectric resonators. This method is an extension of Y. Garault and P. Guillon's method (see Electron Lett., vol.12, pp.475-6, Sept. 1976) from isotropic to anisotropic dielectrics, applied to four different classes of field patterns. Application to high-Q sapphire crystal resonators is discussed.