Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra-low noise
- 1 September 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Vol. 37 (5) , 339-346
- https://doi.org/10.1109/58.105239
Abstract
Phase-noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering gallery mode sapphire ring resonator with Q of 2x10(5). The nature of the mode, which involves little metallic conduction, allows nearly full use of the very low dielectric loss in sapphire. Several mode families have been identified with good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n=5 to n =10 full waves around the perimeter. For a 5-cm wheel resonator in a 7.6-cm container, Q-values of above 10(5) were found at room temperature for all of the modes in this sequence. Coupling Q-values for the same modes ranged from 10(4) (n =5) to 10(5) (n=10) for a WR112 waveguide port at the center of the cylinder wall of the containing can. Phase noise measurements for a transistor oscillator locked to the n=10 (7.84-GHz) mode showed a 1/f(3) dependence for low offset frequencies, and a value of L(f)=-55 dB/Hz at an offset of 10 Hz from the carrier. The oscillator shows phase noise below the previously reported for any X-band source.Keywords
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