A 4.2-ps ECL ring-oscillator in a 285-GHz f/sub MAX/ SiGe technology
- 7 November 2002
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 23 (9) , 541-543
- https://doi.org/10.1109/LED.2002.802654
Abstract
This letter reports on the room temperature operation of a conventional SiGe bipolar ECL ring oscillator with a minimum stage delay of 4.2 ps for /spl sim/250 mV single ended voltage swing. To our knowledge, this is the lowest reported delay for a gate fabricated using transistor devices. The circuit uses 0.12 /spl times/ 2 /spl mu/m/sup 2/ emitter size SiGe n-p-n transistors with a room temperature f/sub T/ of 207 GHz and f/sub MAX/ (unilateral gain extrapolation) of 285 GHz. The ring oscillator was studied as a function of various device and circuit parameters and it was found that minimum delay is more dependent on the parasitic resistance and capacitance in the n-p-n device than on pure transit time across the device.Keywords
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