Dosimetry techniques
- 1 January 1979
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 44 (1-4) , 31-45
- https://doi.org/10.1080/00337577908245978
Abstract
(1979). Dosimetry techniques. Radiation Effects: Vol. 44, No. 1-4, pp. 31-45.Keywords
This publication has 25 references indexed in Scilit:
- Standards for backscattering analysisNuclear Instruments and Methods, 1978
- Energy analyzed secondary ion mass spectroscopy and simultaneous Auger and XPS measurements of ion bombarded surfacesNuclear Instruments and Methods, 1978
- The rotating sample technique for measurement of random backscattering yields from crystals and its application to β-aluminaNuclear Instruments and Methods, 1978
- Ion beam studies: Part IV: The use of multiply-charged and polyatomic ions in an implantation acceleratorNuclear Instruments and Methods, 1977
- A fully automated technique for the rapid assessment of uniformity of doped layers by the four point probe methodRevue de Physique Appliquée, 1977
- Charge Exchange Cross Sections for Electron Loss from B+, P+, and N+ on N2Journal of Applied Physics, 1971
- Measurement of Atomic and Molecular Beam Intensities with a Torsion BalanceReview of Scientific Instruments, 1969
- A simple ion beam scannerNuclear Instruments and Methods, 1967
- Étude de l'émission secondaire d'électrons de cibles épaisses, soumises au bombardement de protons d'énergie 1 MeVJournal de Physique et le Radium, 1963
- A non-intercepting accelerator beam positron sensorNuclear Instruments and Methods, 1962